BS CECC 00013:1985

Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice British Standards Institution / 30-Aug-1985 / 28 pages ISBN: 0580146022

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Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.

Keywords: Electronic equipment and components; Semiconductors ; Semiconductor devices; Integrated circuits; Semiconductor technology; Integrated circuit technology ; Quality assurance systems; Assessed quality; Approval testing; Inspection; Specification (approval) ; Microscopic analysis; Electron microscopes; Non-destructive testing; Test equipment; Testing conditions; Sampling methods; Statistical quality control; Quality control; Specimen preparation

Product Code(s): 00140153,00140153